Achieving high-speed inspection: "QPM Optical Inspection Device"
Mass production of a nano-order surface analysis inspection system! Achieving resolution at the level of a white light interferometer.
The "QPM Optical Inspection System" is a system designed for high-precision quality inspection of semiconductor wafers and laser patterning processes. We offer system concepts tailored to your needs, including a semi-automatic type with manual workpiece supply and a mass production type compatible with CIGS lines. Currently, we are accelerating development towards systemization. We are also conducting test analyses as needed, so please feel free to consult with us. 【System Concept (Semi-Automatic Type)】 ■ Manual workpiece supply ■ Compatible with Φ300mm wafers ■ Small wafers can be accommodated with jig implementation *For more details, please feel free to contact us.
